| ITEM | NAME/DESCRIPTION | PART NO. | BRAND |
| 319 | Standard Timer Dual -55°C 125°C 14-Pin CDIP Tube | M38510/10902BCA | Texas Instruments |
| 320 | Standard Timer Single -40°C 105°C 8-Pin SOIC Tube | NA555D | Texas Instruments |
| 321 | Standard Timer Single -40°C 105°C 8-Pin SOIC T/R | NA555DR | Texas Instruments |
| 322 | Standard Timer Single -40°C 105°C 8-Pin PDIP Tube | NA555P | Texas Instruments |
| 323 | Standard Timer Single -40°C 105°C 8-Pin PDIP Tube | NA555PE4 | Texas Instruments |
| 324 | Standard Timer Dual -40°C 105°C 14-Pin SOIC T/R | NA556DR | Texas Instruments |
| 325 | Standard Timer Single 0°C 70°C 8-Pin SOIC Tube | NE555D | Texas Instruments |
| 326 | Standard Timer Single 0°C 70°C 8-Pin SOIC T/R | NE555DR | Texas Instruments |
| 327 | NE555P | Texas Instruments | |
| 328 | Standard Timer Single 0°C 70°C 8-Pin SOP Tube | NE555PS | Texas Instruments |
| 329 | Standard Timer Single 0°C 70°C 8-Pin SOP T/R | NE555PSR | Texas Instruments |
| 330 | Standard Timer Single 0°C 70°C 8-Pin TSSOP Tube | NE555PW | Texas Instruments |
| 331 | Standard Timer Single 0°C 70°C 8-Pin TSSOP T/R | NE555PWR | Texas Instruments |
| 332 | Standard Timer Dual 0°C 70°C 14-Pin SOIC Tube | NE556D | Texas Instruments |
| 333 | Standard Timer Dual 0°C 70°C 14-Pin SSOP T/R | NE556DBR | Texas Instruments |
| 334 | Standard Timer Dual 0°C 70°C 14-Pin SOIC T/R | NE556DR | Texas Instruments |
| 335 | Standard Timer Dual 0°C 70°C 14-Pin PDIP Tube | NE556N | Texas Instruments |
| 336 | Clock Generator 26.73MHz to 27.27MHz-IN 36.864MHz-OUT 20-Pin SSOP Tube | PLL1700E | Texas Instruments |
| 337 | Clock Generator 1Clock Inputs 20-Pin SSOP Tube | PLL1705DBQ | Texas Instruments |
| 338 | Clock Generator 26.73MHz to 27.27MHz-IN 20-Pin SSOP Tube | PLL1707DBQ | Texas Instruments |
| 339 | Clock Generator 26.73MHz to 27.27MHz-IN Automotive 20-Pin SSOP T/R | PLL1707IDBQRQ1 | Texas Instruments |
| 340 | LMK04832 SP Space Grade Ultra Low Noise JESD204B Dual Loop Clock Jitter Cleaner | PLMK04832W/EM | Texas Instruments |
| 341 | Standard Timer Single -40°C 85°C 8-Pin SOIC Tube | SA555D | Texas Instruments |
| 342 | Standard Timer Single -40°C 85°C 8-Pin SOIC T/R | SA555DR | Texas Instruments |
| 343 | Standard Timer Single -40°C 85°C 8-Pin PDIP Tube | SA555P | Texas Instruments |
| 344 | Standard Timer Dual -40°C 85°C 14-Pin PDIP Tube | SA556N | Texas Instruments |
| 345 | Standard Timer Single -55°C 125°C 8-Pin SOIC T/R | SE555D | Texas Instruments |
| 346 | Standard Timer Single -55°C 125°C 8-Pin SOIC T/R | SE555DG4 | Texas Instruments |
| 347 | Standard Timer Single -55°C 125°C 8-Pin SOIC T/R | SE555DR | Texas Instruments |
| 348 | Standard Timer Single -55°C 125°C 8-Pin CDIP Tube | SE555JG | Texas Instruments |
| 349 | Standard Timer Single -55°C 125°C 8-Pin CDIP Tube | SE555JGB | Texas Instruments |
| 350 | Standard Timer Single -55°C 125°C 8-Pin PDIP T/R | SE555P | Texas Instruments |
| 351 | Standard Timer Dual -55°C 125°C 14-Pin CDIP Tube | SE556J | Texas Instruments |
| 352 | Standard Timer Dual -55°C 125°C 14-Pin CDIP Tube | SE556JB | Texas Instruments |
| 353 | LVDS Repeater 400Mbps 0.454V 38-Pin TSSOP Tube | SN65LVDS108DBT | Texas Instruments |
| 354 | Multiplier 0°C to 70°C 16-Pin PDIP Tube | SN7497N | Texas Instruments |
| 355 | Scan Test Device -40°C to 85°C 56-Pin SSOP Tube | SN74ABT18245ADL | Texas Instruments |
| 356 | Scan Test Device | SN74ABT18245ADLR | Texas Instruments |
| 357 | Scan Test Device | SN74ABT18502PMR | Texas Instruments |
| 358 | Scan Test Device -40°C to 85°C 64-Pin LQFP Tray | SN74ABT18504PM | Texas Instruments |
| 359 | Scan Test Device -40°C to 85°C 24-Pin SOIC Tube | SN74ABT8245DW | Texas Instruments |
| 360 | Scan Test Device | SN74ABT8646DW | Texas Instruments |
| 361 | Scan Test Device | SN74ABT8652DL | Texas Instruments |
| 362 | Scan Test Device -40°C to 85°C 64-Pin LQFP Tray | SN74ABTH182502APM | Texas Instruments |
| 363 | Scan Test Device | SN74ABTH182504APM | Texas Instruments |
| 364 | Scan Test Device | SN74ABTH182652APM | Texas Instruments |
| 365 | Scan Test Device | SN74ABTH18502APMR | Texas Instruments |
| 366 | Scan Test Device -40°C to 85°C 64-Pin LQFP Tray | SN74ABTH18646APM | Texas Instruments |
| 367 | Scan Test Device | SN74ABTH18652APM | Texas Instruments |
| 368 | Bus Termination Array -40°C to 85°C 20-Pin SOIC Tube | SN74ACT1073DW | Texas Instruments |
| 369 | Bus Termination Array -40°C to 85°C 20-Pin SOIC T/R | SN74ACT1073DWR | Texas Instruments |
| 370 | Bus Termination Array -40°C to 85°C 20-Pin SOP T/R | SN74ACT1073NSR | Texas Instruments |
| 371 | Scan-Path Linker 0°C to 70°C 28-Pin SOIC Tube | SN74ACT8997DW | Texas Instruments |
| 372 | Voltage Level Translator Bidirectional 48-Pin TSSOP T/R | SN74AVCA406DGGR | Texas Instruments |
| 373 | Scan Test Device | SN74BCT8245ADWR | Texas Instruments |
| 374 | Scan Test Device | SN74BCT8374ADW | Texas Instruments |
| 375 | Frequency Dividers/Digital Timers 0°C to 70°C 16-Pin PDIP Tube | SN74LS292N | Texas Instruments |
| 376 | high-speed Clock Synthesizer | SN74LS297N | Texas Instruments |
| 377 | Active Multiple Delay Line 8-IN 95ns MAX 16-Pin SOP T/R | SN74LS31NSR | Texas Instruments |
| 378 | HIGH-SPEED CMOS LOGIC PHASE-LOCKED LOOP WITH VCO | SN74LV4046ADGVR | Texas Instruments |
| 379 | HIGH-SPEED CMOS LOGIC PHASE-LOCKED LOOP WITH VCO | SN74LV4046ANS | Texas Instruments |
| 380 | HIGH-SPEED CMOS LOGIC PHASE-LOCKED LOOP WITH VCO | SN74LV4046ANSR | Texas Instruments |
| 381 | Oscillator Driver -40°C to 125°C 8-Pin SSOP T/R | SN74LVC1404DCTR | Texas Instruments |
| 382 | Oscillator Driver -40°C to 125°C 8-Pin VSSOP T/R | SN74LVC1404DCUR | Texas Instruments |
| 383 | Oscillator Driver -40°C to 85°C 8-Pin DSBGA T/R | SN74LVC1404YZPR | Texas Instruments |
| 384 | Scan Test Device | SN74LVT18512DGGR | Texas Instruments |
| 385 | Transceiver -40°C to 85°C 64-Pin LQFP Tray | SN74LVT8986PM | Texas Instruments |
| 386 | Addressable Scan Port -40°C to 85°C 24-Pin TSSOP T/R | SN74LVT8996IPWREP | Texas Instruments |
| 387 | Addressable Scan Port -40°C to 85°C 24-Pin TSSOP Tube | SN74LVT8996PW | Texas Instruments |
| 388 | Scan Test Device -40°C to 85°C 64-Pin LQFP Tray | SN74LVTH182504APM | Texas Instruments |
| 389 | Scan Test Device | SN74LVTH182512DGGR | Texas Instruments |
| 390 | Scan Test Device | SN74LVTH182646APM | Texas Instruments |
| 391 | Scan Test Device -40°C to 85°C 64-Pin LQFP Tray | SN74LVTH18502APM | Texas Instruments |
| 392 | Scan Test Device | SN74LVTH18504APMR | Texas Instruments |
| 393 | Scan Test Device -40°C to 85°C 64-Pin LQFP Tray | SN74LVTH18646APM | Texas Instruments |
| 394 | Scan Test Device | SN74LVTH18652APM | Texas Instruments |
| 395 | Scan-Path Linker -55°C to 125°C 28-Pin CDIP Tube | SNJ54ACT8997JT | Texas Instruments |
| 396 | Scan Test Device | SNJ54BCT8240AFK | Texas Instruments |
| 397 | Scan Test Device -40°C to 85°C 24-Pin CDIP Tube | SNJ54BCT8245AJT | Texas Instruments |
